N. Kannababu, S. Rakshit, R. Madhusudhana, V. A. Tonapi, I. K. Das, and K. Raghunath, “Identification of superior parental lines for seed quality and storability through GGE biplot analysis of line × tester data in grain sorghum”, Indian J. Genet., vol. 77, no. 2, May 2017, Accessed: Jun. 25, 2026. [Online]. Available: https://epubs.icar.org.in/index.php/IJGPB/article/view/70832