Kannababu N, Rakshit S, Madhusudhana R, Tonapi VA, Das IK, Raghunath K. Identification of superior parental lines for seed quality and storability through GGE biplot analysis of line × tester data in grain sorghum. Indian J. Genet. [Internet]. 2017 May 31 [cited 2026 Jun. 25];77(2). Available from: https://epubs.icar.org.in/index.php/IJGPB/article/view/70832