LATWAL, Chandni; , Deepshikha; KUMARI, Bimla; SINGH, Pawan Kumar; JAISWA, Jai Prakash. Characterization of bread wheat germplasm for spot blotch resistance and its association with yield and yield related traits. Journal of Cereal Research, India, v. 8, n. 2, 2016. DOI: 10.25174/2wqkge72. Disponível em: https://epubs.icar.org.in/index.php/JWR/article/view/67140. Acesso em: 22 jun. 2026.