Latwal C, , D, Kumari B, Singh PK, Jaiswa JP. Characterization of bread wheat germplasm for spot blotch resistance and its association with yield and yield related traits. JCR [Internet]. 2016 Dec. 31 [cited 2026 Jun. 22];8(2). Available from: https://epubs.icar.org.in/index.php/JWR/article/view/67140