Molecular characterization and yield evaluation of near isogenic line (NIL) of wheat cultivar PBW 343 developed for Karnal bunt resistance

Authors

  • SATISH KUMAR*, CHANDRA NATH MISHRA, VIKAS GUPTA, RAJENDER SINGH and INDU SHARMA

Keywords:

Karnal bunt, near isogenic lines, PBW 343, wheat

Abstract

For Indian wheat to be export ready there is a need to satisfy the quarantine requirements of international standards. However, Karnal bunt (KB) disease of wheat can be a hindrance. Karnal bunt caused by Neovossia indica (Mitra) is an important wheat disease. Currently, resistance breeding is being pursued as the main strategy for its management. As a breeding strategy, near isogenics lines (NILs) were developed in the background of wheat cultivar PBW 343. Backcross breeding was utilized to incorporate the KB resistance from a registered genetic stock KBRL 22. The near isogenics lines so developed were evaluated for resistance at every generation of selfing after six backcrosses. One of these resistant lines, KB 2012-03 was evaluated for yield across five different locations in the North western plains zone (NWPZ) of India. Simultaneously 194 SSR markers were used to characterize the parents, PBW 343 and KBRL 22 and the near isogenics line (NIL) KB 2012-03. Out of these, 47 markers were polymorphic between the parents. 11 SSR markers were able to characterize the regions specific to KBRL 22 thus specifying that the resistant regions have been incorporated. The multi-location yield testing also revealed that on average basis the near isogenics line (NIL) KB 2012-03 (41.2 q/ha) yielded significantly superior than the parental check PBW 343 (35.7 q/ha). This line can act as a source of Karnal bunt resistance.

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Issue

Vol. 69 No. 2 (2016): Indian Phytopathology

Section

Research Articles

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How to Cite

VIKAS GUPTA, RAJENDER SINGH and INDU SHARMA, S. K. C. N. M. (2016). Molecular characterization and yield evaluation of near isogenic line (NIL) of wheat cultivar PBW 343 developed for Karnal bunt resistance. Indian Phytopathology, 69(2), 119-123. http://epubs.icar.org.in/ejournal/index.php/IPPJ/article/view/58379