Dissection of wheat spot blotch disease resistance QTLs in to single Mendelian genes
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Authors
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Suneel Kumar
The Energy and Resources Institute (TERI), Lodhi Road, New Delhi 110 003,
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Shashi Bhushan Tripathi
The Energy and Resources Institute (TERI), Lodhi Road, New Delhi 110 003,
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Uttam Kumar
Borlang Institute for South Asia (BISA), Ludhiana 141 004, Punjab
Abstract
Two QTLs imparting spot blotch resistance and located on
chromosomes 2BS and 5BL were dissected in to a single
Mendelian gene using 341 single seed descent (SSD) derived
F3 and F4 lines of YS102 × Sonalika and 335 F3, F4 and F5
lines of YS116 × Sonalika cross. The resistant parental lines
YS102 and YS116 were selected on the basis of phenotypic
and genotyping data of base mapping population (Yangmai
6 × Sonalika in F12 generation) used for QTL mapping. Both
the populations were tested for spot blotch resistance
under artificial epiphytotic conditions in the field. Disease
severity (%) and AUDPC values of each line were calculated.
The parent YS116 was known to possess a single major
QTL on chromosome 5BL, while YS102 possess QTL on
chromosome 2BS. The test for goodness of fit (1:2:1 in F3,
3:2:3 in F4 and 7:2:7 in F5 generations) confirmed
segregation at one locus in both the crosses. These SSD
derived lines from both the crosses may further be used for
fine mapping and map based cloning of the QTLs of spot
blotch resistance OTLs