Identification of amplified fragment length polymorphism markers associated with Karnal bunt (Neovossia indica) resistance in bread wheat
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Keywords:
amplified fragment length polymorphism markers, Karnal bunt, marker aided selection, Neovossia indica, Triticum aestivumAbstract
Amplified fragment length polymorphism markers were used to study polymorphism and their association withKarnal bunt resistance genes in wheat (Triticum aestivum L. emend. Fiori & Paol.). Recombinant inbred lines developed
from a cross of a Karnal bunt susceptible 'WL 711' and a Kamal-bunt resistant line 'HD 29' were tested for
resistance to 2 Kamal bunt isolates through artificial inoculations. Study of parents and a set of recombinant inbred
lines (selected on the basis of Karnal bunt reaction) for amplified fragment length polymorphism with 6 primer combinations
were analyzed and 336 loci scored. Of these, 77 were polymorphic between the parents. Three of the polymorphic
markers were associated with Karnal bunt resistance genes.
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How to Cite
SINGH, S., GREWAL, T. S., SINGH, H., SODHI, M., & DHALIWAL, H. S. (2013). Identification of amplified fragment length polymorphism markers associated with Karnal bunt (Neovossia indica) resistance in bread wheat. The Indian Journal of Agricultural Sciences, 69(7). https://epubs.icar.org.in/index.php/IJAgS/article/view/26844